Built-In-Chip Testing of Voltage Overshoots in High-Speed SoCs
نویسندگان
چکیده
We present a methodology to detect and measure the signal overshoots occurring on the interconnects of high-speed system-on-chips. Overshoots are known to inject hot-carriers into the gate oxide which cause permanent degradation of MOSFET transistors’ performance over time. We propose a built-in chip mechanism to detect overshoots, collect the occurrence information and scan them out efficiently and inexpensively for built-in self-test, reliability analysis and diagnosis.
منابع مشابه
Detecting signal-overshoots for reliability analysis in high-speed system-on-chips
The rising level of complexity and speed of SoC makes it increasingly vital to test adequately the system for signal integrity. Voltage overshoot is one of the integrity factors that has not been sufficiently addressed for the purpose of testing and reliability. Overshoots are known to inject hot-carriers into the gate oxide and cause permanent degradation of MOSFET transistors’ performance. Th...
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